Mengganti Mikrokontroller Mesin Dust Collector pada PT. xxx dengan PLC OMRON CP1E-NA20CD-R

Authors

  • Surawan Setiyadi President University
  • Edo Aulia Billy Fany President University

DOI:

https://doi.org/10.33021/jeee.v3i2.1490

Abstract

As a result of the production of powder processing causes a lot of dust around the production machine and factory. This of course can cause pollution. Dust needs to be collected using a Dust Collector (DC) machine. The controller on the DC machine at PT. xxx is often damaged in the control unit and requires repairs at a cost of around Rp. 5,000,000 per unit. In facts there are about 10 units of machines at PT.xxx that must work all. Because of DC machines are often damaged in their controllers, the maintenance department made a development to make replacement DC machine controllers. Namely using the Programmable Logic Controller (PLC). This PLC replaces the microcontroller unit on the DC machine, PLC uses ladder diagram programming language that is easily understood by some people working in the world of control. PLC parts that are easily found in the market and programming languages that are easy to understand and reliability make one of the reasons this PLC is used to replace the microcontroller unit.

Author Biographies

Surawan Setiyadi, President University

Study Program of Electrical Engineering,

Edo Aulia Billy Fany, President University

1Study Program of Electrical Engineering

References

Dust Collector User Manual

OMRON User's Manual, CP1E Unit Hardware Sysmac CP Series, p30, 2016

OMRON User's Manual, CP1E Unit Hardware Sysmac CP Series, p35, 2016

Autonics, Spesifikasi Sensor Tekanan PSAN [Online]. Tersedia: https://www.autonics.com/model/A1900000121. (Diakses: 27 Mei 2019)

Autonics, Sensor Tekanan PSAN [Online]. Tersedia: https://www.autonics.com/series/3000473. (Diakses: 27 Mei 2019)

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Published

2021-04-12

How to Cite

Setiyadi, S., & Fany, E. A. B. (2021). Mengganti Mikrokontroller Mesin Dust Collector pada PT. xxx dengan PLC OMRON CP1E-NA20CD-R. Journal of Electrical And Electronics Engineering, 3(2). https://doi.org/10.33021/jeee.v3i2.1490

Issue

Section

Articles